Slim Water Injection Nozzle for Silicon Wafer Wet Cleaning Bath
- 1 Department of Chemical and Energy Engineering, Yokohama National University, Yokohama, Japan
- 2 Department of Chemical and Energy Engineering, Yokohama National University, Yokohama, Japan
- 3 Department of Chemical and Energy Engineering, Yokohama National University, Yokohama, Japan
- 4 Department of Chemical and Energy Engineering, Yokohama National University, Yokohama, Japan
- 5 Shizuoka Factory, Pre-Tech Co., Ltd., Yaizu, Japan
Abstract
In order to effectively and quickly clean the surface of semiconductor silicon wafers, the fluid flow is one of the significant issues. For a batch-type silicon wafer wet cleaning bath, a slim water injection nozzle consisting of a dual tube was studied, based on theoretical calculations and experiments. A thin inner tube was placed at the optimum position in the water injection nozzle. Such a simple design could make the water injection direction normal and the water velocity profile symmetrical along the nozzle. The water flow in the wet cleaning bath was observed using a blue-colored ink tracer. When the nozzle developed in this study was placed at the bottom of the bath, a fast and symmetrical upward water stream was formed between and around the wafers.
- Chang, C.Y. and Sze, S.M. (1996) ULSI Technology. McGraw-Hill, New York.
- Shimura, F. (1989) Semiconductor Silicon Crystal Technology. Academic Press, San Diego.
- Knotter, D.M., de Gendt, S., Mertens, P.W. and Heyns, M.M. (2000) Silicon Surface Roughening Mechanisms in Ammonia Hydrogen Peroxide Mixtures. Journal of the Electrochemical Society, 147, 736-740. http://dx.doi.org/10.1149/1.1393261
- Choia, G.M. and Ohmi, T. (2001) Removal Efficiency of Metallic Impurities on Various Substrates in HF-Based Solutions. Journal of the Electrochemical Society, 148, G241-G248. http://dx.doi.org/10.1149/1.1360189
- Gale, G.W., Rath, D.L., Cooper, E.I., Estes, S., Okorn-Schmidt, H.F., Brigante, J., Jagannathan, R., Settembre, G. and Adams, E. (2001) Enhancement of Semiconductor Wafer Cleaning by Chelating Agent Addition. Journal of the Electrochemical Society, 148, G513-G516. http://dx.doi.org/10.1149/1.1391273
- Miyashita, N., Uekusa, S. and Katsumata, H. (2002) Characterization of a New Cleaning Method Using Electrolytic Ionized Water for Polysilicon Chemical Mechanical Polishing Process. Japanese Journal of Applied Physics, 41, 5098-5103. http://dx.doi.org/10.1143/JJAP.41.5098
- Vos, R., Lux, M., Xu, K., Fyen, W., Kenens, C., Conard, T., Mertens, P., Heyns, M., Hatcher, Z. and Hoffman, M. (2001) Removal of Submicrometer Particles from Silicon Wafer Surfaces Using HF-Based Cleaning Mixtures. Journal of the Electrochemical Society, 148, G683-G691. http://dx.doi.org/10.1149/1.1413483
- Chena, Z. and Singh, R.K. (2003) Mechanism of Particle Deposition on Silicon Surface during Dilute HF Cleans. Journal of the Electrochemical Society, 150, G667-G672. http://dx.doi.org/10.1149/1.1610469
- Abbadi, A., Crescente, F. and Semeria, M.N. (2004) Advanced Wet Cleanings Post-CMP Application to Reclaim Wafers. Journal of the Electrochemical Society, 151, G57-G66. http://dx.doi.org/10.1149/1.1630809
- Ng, D., Huang, P.Y., Jeng, Y.R. and Liang, H. (2007) Nanoparticle Removal Mechanisms during Post-CMP Cleaning. Electrochemical and Solid-State Letters, 10, H227-H231. http://dx.doi.org/10.1149/1.2739817
- Claes, M., De Gendt, S., Kenens, C., Conard, T., Bender, H., Storm, W., Bauer, T., Mertens, P. and Heyns, M.M. (2001) Controlled Deposition of Organic Contamination and Removal with Ozone-Based Cleanings. Journal of the Electrochemical Society, 148, G118-G125. http://dx.doi.org/10.4028/www.scientific.net/ssp.76-77.223