Simple and Rapid Spectrophotometric Determination of Titanium on Etched Aluminum Foils — Oak Academic Publishing
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Simple and Rapid Spectrophotometric Determination of Titanium on Etched Aluminum Foils
Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center of Dielectric Research, Xi’an Jiaotong University, Xi’an, China
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Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center of Dielectric Research, Xi’an Jiaotong University, Xi’an, China
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Zhaoqing Hua Feng Electronic Aluminum Foil Co., Ltd., Zhaoqing, China
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Zhaoqing Hua Feng Electronic Aluminum Foil Co., Ltd., Zhaoqing, China
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Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center of Dielectric Research, Xi’an Jiaotong University, Xi’an, China
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Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center of Dielectric Research, Xi’an Jiaotong University, Xi’an, China
1 Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center of Dielectric Research, Xi’an Jiaotong University, Xi’an, China
2 Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center of Dielectric Research, Xi’an Jiaotong University, Xi’an, China
5 Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center of Dielectric Research, Xi’an Jiaotong University, Xi’an, China
6 Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center of Dielectric Research, Xi’an Jiaotong University, Xi’an, China
Introduction of titanium oxides with high permittivity on etched aluminum foils’ surface has been successfully utilized to increase specific capacitance of anode foils for aluminum electrolytic capacitors. In order to quantify the concentration of titanium (IV) on the etched aluminum foil precisely, a simple and rapid spectrophotometric procedure has been developed. After optimizing a series of variables including absorbance wavelength, concentration of nitric acid, concentration of hydrogen peroxide, nitration time and developing time, analytical precision and accuracy were tested by using standard working solution containing known amount of titanium (IV). The results showed that Lambert-Beer’s law was obeyed in the range of 0.01 to 3.00 mmol·L ﹣1 . The relative standard deviation (RSD) ranged from 0.67% to 1.09% (n = 6), and the recovery was between 99.17% - 100. 03%. Investigation on effect of Al 3+ ion indicated that there was no interference in the absorbance of titanium (IV) at 410 nm. The proposed procedure was applied to real samples for the determination of titanium (IV), and the results were in a good agreement with the values certified by inductively coupled plasma-atomic emission spectrometry (ICP-AES).
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