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Study of Ni/Al Interface Diffusion by Molecular Dynamics Simulation
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Abstract
Molecular dynamics simulation of Ni/Al interface diffusion is carried out by Embedded Atom Method (EAM) potential. The problem how the temperature affects Ni/Al interface diffusion is discussed. The initial dynamic behavior of Ni/Al interface diffusion at high temperature is shown. The study in this letter is helpful to understand the origin of diffusion phenomenon.
KeywordsMolecular Dynamics SimulationInterface DiffusionEAM Potential
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