Analysis and Research on Low-Cost and Non-Intrusive Power Metering Chip
- 1 State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology, Beijing Smart-Chip Microelectronics Technology Co., Ltd. Beijing, China
- 2 State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology, Beijing Smart-Chip Microelectronics Technology Co., Ltd. Beijing, China
- 3 State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology, Beijing Smart-Chip Microelectronics Technology Co., Ltd. Beijing, China
- 4 State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology, Beijing Smart-Chip Microelectronics Technology Co., Ltd. Beijing, China
- 5 Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd. Beijing, China
- 6 Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd. Beijing, China
- 7 Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd. Beijing, China
- 8 Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd. Beijing, China
Abstract
Metering technology is one of the core technologies of the smart power grid. The overall metering solution and related products have a wide market space in the whole process of power production, which bring new opportunities for power distribution development from automation to intelligentialize, and provide technical supports for the power metering system platform. Because of the importance of metering products and their market demand, this paper focuses on the design of a simple power metering chip with low-cost, low-precision and non-invasive, so as to lay the foundation for the development and practical technology accumulation of power metering products. The design achieves low cost by reducing the acquisition accuracy, simplifying the collection and sampling methods. This paper studies the chip accuracy, sampling methods, collection methods, and the inference of the chip characteristics requirements.
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