X-Ray Powder Diffraction: Why Not Use CuKβ Radiation?
- 1 Materialwissenschaftliche Kristallographie, Clausthal University of Technology, Clausthal-Zellerfeld, Germany
Abstract
Cu Kβ radiation with a wavelength of λ = 1.3923 ? is recommended for crystal structure determination from X -ray powder diffraction using the Rietfeld method. A highly sensitive image plate detector is able to collect enough intensity to record a brilliant X -ray powder pattern in a reasonable time, compared to Cu Kα1 radiation used today. Especially atomic displacement coefficients could be determined more precisely with the much greater number of reflections recorded. A double-radius Guinier camera attached to a micro-focus rotating anode tube ensures increased brilliance besides high resolution. A simple construction specification is presented to make smart cylindrically bent Ge(111) or Si(111) X -ray monochromators that deliver focused Cu Kβ radiation. The highly linear response of image plate detectors allows removing of fluorescence radiation simply as background of the pattern. The proposed equipment is a cost-efficient alternative to a liquid gallium-metal-jet X -ray source with maximum power load and a similar wavelength of λ (Ga Kα1 ) = 1.34013 ?.
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