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Absolute Wall Thickness Measurement of Conducting Plates Using Pulsed Eddy Currents
BonPhysics Research and Investigations BV, Puttershoek, Netherlands
BonPhysics Research and Investigations BV, Puttershoek, Netherlands
- 1 BonPhysics Research and Investigations BV, Puttershoek, Netherlands
- 2 BonPhysics Research and Investigations BV, Puttershoek, Netherlands
Journal of Electromagnetic Analysis and Applications·Volume 16 (2024)·Pages 25–41·Published 31 March 2024·DOI10.4236/jemaa.2024.163003
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Abstract
The method using pulsed eddy currents to determine the thickness of a conduction plate is extended to enable the simultaneous measurement of the plate thickness and material properties. For optimal performance, a probe must be designed depending on the thickness range that should be accessible. The need for a calibration of the material properties of a conducting plate to enable the measurement of its thickness has been removed. All that is needed is a probe with known dimensions and suitable hardware to create a current pulse and measure a transient magnetic induction.
KeywordsPulsed Eddy CurrentsWall ThicknessAbsolute and Relative Measurements
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