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Structural, Electrical and Optical Characterization Studies on Glycine Picrate Single Crystal : A Third Order Nonlinear Optical Material
Department of Physics, Government Arts College for Women, Pudukkottaii –622001, India.
Department of Physics, St. Joseph’s College (Autonomous), Tiruchirappalli –620002, India.
Crystal Growth and Thin Film Laboratory, School of Physics, Bharathidasan University,Tiruchirappalli –620024, India.
Crystal Growth and Thin Film Laboratory, School of Physics, Bharathidasan University,Tiruchirappalli –620024, India.
Materials Characterization Division, National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi-110 012, India
- 1 Department of Physics, Government Arts College for Women, Pudukkottaii –622001, India.
- 2 Department of Physics, St. Joseph’s College (Autonomous), Tiruchirappalli –620002, India.
- 3 Crystal Growth and Thin Film Laboratory, School of Physics, Bharathidasan University,Tiruchirappalli –620024, India.
- 4 Crystal Growth and Thin Film Laboratory, School of Physics, Bharathidasan University,Tiruchirappalli –620024, India.
- 5 Materials Characterization Division, National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi-110 012, India
Journal of Minerals and Materials Characterization and Engineering·Volume 08 (2009)·Pages 755–763·Published 20 October 2009·DOI10.4236/jmmce.2009.810065
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Abstract
Single crystal of an organic nonlinear optical (NLO) material, Glycine picrate (GP), was grown by slow cooling method. The structural perfection of the grown crystal was analyzed by highresolution X-ray diffraction (rocking curve) measurements. UV-Visible-NIR spectral analysis was used to determine the optical constants and band gap of GP. The nature of variation of dielectric constant with frequency at different temperatures was investigated. Third-order optical nonlinearities of GP crystal were investigated. Etch patterns of the grown crystal quality were studied.
KeywordsX-ray diffractionGrowth from solutionsSingle crystal growthNonlinear optic materials
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