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The Electrical Properties of Al/Methylene-Blue/n-Si/Au Schottky Diodes
Department of Physics, Faculty of Science, University of Yüzüncüyil, Van, Turkey
- 1 Department of Physics, Faculty of Science, University of Yüzüncüyil, Van, Turkey
Journal of Modern Physics·Volume 07 (2016)·Pages 1–6·Published 6 January 2016·DOI10.4236/jmp.2016.71001
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Abstract
We studied the electrical characteristics of Al/methylene-blue/n-Si/Au Schottky diodes such as current-voltage, conductance-capacitance-voltage, and conductance-capacitance-frequency. We plotted rectification ratio vs. voltage (RR-V) of the diode. From I-V plots of the diodes, saturation current ( I o ), and ideality factor ( n ) were calculated. Barrier height (eΦ B ) and series resistance ( R S ) were calculated with Norde functions. The results show that in the Al/methylene-blue/n-Si/Au diode, the methylene-blue layer has a significant impact on electrical properties such as series resistance, barrier height, ideality factor, conductance, rectification ratio, and capacitance.
KeywordsOrganic Schottky DiodesSchottky Barrier DiodesMethylene-Blue Layer
- Kiliçoglu, T., Aydin, M.E. and Ocak, Y.S. (2007) Physica B: Condensed Matter, 388, 244-248. http://dx.doi.org/10.1016/j.physb.2006.06.126
- Kiliçoglu, T. (2008) Thin Solid Films, 516, 967-970. http://dx.doi.org/10.1016/j.tsf.2007.06.022
- Ocak, Y.S., Kulakçi, M., Kiliçoglu, T., Turan, R. and Akkiliç, K. (2009) Synthetic Metals, 159, 1603-1607. http://dx.doi.org/10.1016/j.synthmet.2009.04.024
- Soylu, M., Al-Hartomy, O.A., Al Said, S.A.F., Al-Ghamdi, A.A., Yahia, I.S. and Yakuphanoglu, F. (2013) Microelectronics Reliability, 53, 1901-1906. http://dx.doi.org/10.1016/j.microrel.2013.05.008
- Zeyrek, S., Acaroglus, E., Altindal, S., Birdogan, S. and Bülbül, M.M. (2013) Current Applied Physics, 13, 1225-1230. http://dx.doi.org/10.1016/j.cap.2013.03.014
- Bülbül, M.M., Zeyrek, S., Altindal, S. and Yüzer, H. (2006) Microelectronic Engineering, 83, 577-581. http://dx.doi.org/10.1016/j.mee.2005.12.013
- Yüksel, Ö.F., Tugluoglu, N., Gülveren, B., Safak, H. and Kus, M. (2013) Journal of Alloys and Compounds, 577, 30-36. http://dx.doi.org/10.1016/j.jallcom.2013.04.157
- Gupta, R.K. and Singh, R.A. (2004) Materials Chemistry and Physics, 86, 279-283. http://dx.doi.org/10.1016/j.matchemphys.2004.03.003
- Readdy, V.R. (2014) Thin Solid Films, 556, 300-306. http://dx.doi.org/10.1016/j.tsf.2014.01.036
- Liou, B.W. (2013) Thin Solid Films, 545, 509-513.
- Yahia, I.S., Farag, A.A.M., Yakuphanoglu, F. and Farrooq, W. A. (2011) Synthetic Metal, 161, 880-887.
- Farag, A.A.M. and Yahia, I.S. (2011) Synthetic Metals, 161, 32-39. http://dx.doi.org/10.1016/j.synthmet.2010.10.030
- Zhu, M.G., Zhang, J. and Hou, H.N. (2012) Microelectronic Engineering, 95, 112-115.
- Soylu, M. (2011) Material Science in Semiconductor Processing, 14, 212-218.