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On Radioactivity–Exposed Nanophotodetector Optoreliability
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Journal of Modern Physics·Volume 02 (2011)·Pages 766–770·Published 7 July 2011·DOI10.4236/jmp.2011.27089
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Abstract
The optoelectronic reliability of representative radioactivity-exposed nanophotodetectors and the degree of functionally tolerable radioactivity-induced responsivity de-emphasis, against increasing cumulative radioactivity-dose, is notionally considered and modelled, with a view towards experimental findings concerning p-i-n photosensors being exposed to regulated successive (α, β)-particle bombardments.
KeywordsRadiation-HardnessOptoelectronic ReliabilityPhotodetectorsPhotoresponsive NanointerfacesQuantum Efficiency &Detection Yield
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