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Analysis of Recent Secure Scan Test Techniques
Institute of International Finance and Banking University of Science and Technology Liaoning, Anshan, China
Department of Computer Science & Engineering, Hanyang University, Seoul, Korea
Institute of International Finance and Banking University of Science and Technology Liaoning, Anshan, China
- 1 Institute of International Finance and Banking University of Science and Technology Liaoning, Anshan, China
- 2 Department of Computer Science & Engineering, Hanyang University, Seoul, Korea
- 3 Institute of International Finance and Banking University of Science and Technology Liaoning, Anshan, China
Journal of Software Engineering and Applications·Volume 09 (2016)·Pages 91–101·Published 17 March 2016·DOI10.4236/jsea.2016.93008
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Abstract
Side channel attack may result in user key leakage as scan test techniques are applied for crypto-graphic chips. Many secure scan designs have been proposed to protect the user key. This paper meticulously selects three current scan test techniques, analyses their advantages and disadvantages and also compares them in security and area overhead. Users can choose one of them according to the requirements and further combination can be implemented to achieve better performance.
KeywordsSide Channel AttackScan Test TechniquesSecure Scan Designs
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