Influence of Temperature on the Measuring Accuracy of Devices Based on Surface Plasmon Resonance Phenomenon

Abstract

The main reasons for the occurrence of temperature error and perspective directions of decreasing of its value are presented by improving the device design based on the phenomenon of surface plasmon resonance (SPR) and numerical methods of processing the results of measurements by this device. The most essential influence on changes in results of measurements can be rendered by temperature changes in the analyte refractive index. It is shown that the application of the integrated temperature stabilization of the device with the test substance, and numerical processing of the measurement results for compensation of temperature changes of the test substance and the use of film heaters it is possible to reduce the measurement error of the refractive index of the analyte at least 30 times from 2.4 × 10 -4 to 7.6 × 10 -6 .