Effect of Calcinations Temperature on Crystallography and Nanoparticles in ZnO Disk
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Abstract
We proposed a good calcinations condition of the ZnO disk to control the crystallography and nanoparticles in ZnO disk. The crystallography of precursor powder and disk powder were analyzed by the X-ray diffraction (XRD). The mean nanoparticles of ZnO disk was determinate by XRD results and observed by scanning electron microscope. The temperature ranges of 400℃ to 650℃ in air for 30 minutes were used calcinations ZnO disk. These temperature can be controlled the single phase, lattice parameters, unit cell volume, crystalline size, d-value, texture coefficient and bond lengths of Zn–Zn, Zn–O and O–O which correspond significantly the hexagonal crystal structure. The nanoparticles were small changed mean of 76.59 nm at the calcinations temperature range.
- D. Xu, X. F. Shi, X. N. Cheng, J. Yang, Y. E. Fan, H. M. Yuan and L. Y. Shi, “Microstructure and Electrical Properties of Lu2O3–Doped ZnO–Bi2O3–Based Varistor Ceramics,” Transactions of Nonferrous Metals Society of China, Vol. 20, No. 12, December 2010, pp. 2303-2308. doi:10.1016/S1003-6326(10)60645-0
- N. Hagura, T. Ogi, T. Shirahama, F. Iskandar and K. Okuyama, “Highly luminescent Silica–Coated ZnO Nano- particles Dispersed in Anaqueousmedium,” Journal of Luminescence, Vol. 131, No. 5, May 2011, pp. 921-925. doi:10.1016/j.jlumin.2010.12.024
- C. Li, S. Zhang, M. Hu and C. Xie, “Nanostructural ZnO Based Coplanar Gas Sensor Arrays from the Injection of Metal Chloride Solutions: Device Processing, Gas-Sens- ing Properties and Selectivity in Liquors Applications,” Sensors and Actuators B, Vol. 153, No. 2, April 2011, pp. 415-420. .doi:10.1016/j.snb.2010.11.008
- A. P. Popov, A. V. Priezzhev, J. Lademann and R. Myllyl?, “Alteration of Skin Light–Scattering and Absorption Properties by Application of Sunscreen Nanoparticles: A Monte Carlo Study,” Journal of Quantitative Spectroscopy & Radiative Transfer, 2011, Article in Press.
- X. Qu, W. Wang, S. Lva and D. Jia, “Thermoelectric Properties and Electronic Structure of Al–Doped ZnO,” Solid State Communications, Vol. 151, No. 4, February 2011, pp. 332-336. doi:10.1016/j.ssc.2010.11.020
- C. Chen, B. Yu, J. Liu, Q. Dai and Y. Zhu, “Investigation of ZnO Films on Si(111) Substrate Grown by Low Energy O+ Assisted Pulse Laser Deposited Technology,” Material Letters, Vol. 61, No. 14-15, June 2007, pp. 2961-2964.
- D. P. Padiyan and A. Marikani, “X–Ray Determination of Lattice Constants of CdXSn1–XSe Mixed Crystal Systems,” Crystal Research and Technology, Vol. 37, No. 11, November 2002, pp. 1241-1248. doi:10.1002/1521-4079(200211)37:11 3.0.CO;2-C
- C. S. Barret, T. B. Massalski, “Structure of Metals,” Pergamon Press, Oxford, 1980.
- Joint Committee on Powder Diffraction Standards, Powder Diffraction File, Card No: 891397.
- H. Schulz and K.H. Thiemann, “Structure Parameters and Polarity of the Wurtzite Type Compounds Sic–2H and ZnO,” Solid State Communications, Vol. 32, No. 9, December 1997, pp. 783-785.
- S. Aksoy, Y. Caglar, S. Ilican and M. Caglar, “Effect of Deposition Temperature on the Crystalline Structure and Surface Morphology of ZnO Films Deposited on p–Si,” Advances in Control, Chemical Engineering, Civil Engineering and Mechanical Engineering, ISBN: 978–960–474–251–6, pp. 227-231.