Optimization and Modeling of Antireflective Layers for Silicon Solar Cells: In Search of Optimal Materials
- 1 Laboratory of Semiconductor and Solar Energy, Department of Physics, Faculty of Science and Techniques, University Cheikh Anta Diop, Dakar, Senegal
- 2 Laboratory of Semiconductor and Solar Energy, Department of Physics, Faculty of Science and Techniques, University Cheikh Anta Diop, Dakar, Senegal
- 3 Laboratory of Semiconductor and Solar Energy, Department of Physics, Faculty of Science and Techniques, University Cheikh Anta Diop, Dakar, Senegal
- 4 Laboratory of Semiconductor and Solar Energy, Department of Physics, Faculty of Science and Techniques, University Cheikh Anta Diop, Dakar, Senegal
- 5 Laboratory of Semiconductor and Solar Energy, Department of Physics, Faculty of Science and Techniques, University Cheikh Anta Diop, Dakar, Senegal
- 6 Laboratory of Semiconductor and Solar Energy, Department of Physics, Faculty of Science and Techniques, University Cheikh Anta Diop, Dakar, Senegal
- 7 Laboratory of Semiconductor and Solar Energy, Department of Physics, Faculty of Science and Techniques, University Cheikh Anta Diop, Dakar, Senegal
- 8 Laboratory of Semiconductor and Solar Energy, Department of Physics, Faculty of Science and Techniques, University Cheikh Anta Diop, Dakar, Senegal
Abstract
Depositing an antireflection coating on the front surface of solar cells allows a significant reduction in reflection losses. It thus allows an increase in the efficiency of the cells. A modeling of the refractive indices and the thicknesses of an optimal antireflection coating has been proposed. Thus, the average reflective losses can be reduced to less than 8% and less than 2.4% in a large wavelength range respectively for a single-layer and double-layer anti-reflective coating types. However, the difficulty of finding these model materials (materials with the same refractive index) led us to introduce two notions: the refractive index difference and the thickness difference. These two notions allowed us to compare the reflectivity of the antireflection layer in silicon surface. Thus, the lower the refractive index difference is, the more the material resembles to the ideal material (in refractive index), and thus its reflective losses are minimal. SiNx and SiO 2 /TiO 2 antireflection layers, in the wavelength range between 400 and 1100 nm, have reduced the average reflectivity losses to less than 9% and 2.3% respectively.
- Lee, Y., Gong, D., Balaji, N., Lee, Y.J. and Yi, J. (2012) Stability of SiNX/SiNX Double Stack Antireflection Coating for Single Crystalline Silicon Solar Cells. Nanoscale Research Letters, 7, 50. https://doi.org/10.1186/1556-276X-7-50
- Dmitriev, P.A., Baranov, D.A., Mukhin, I.S. and Samusev, A.K. (2015) Antireflective Properties of Periodic Nanopore Arrays. Proceedings of the International Conference Days on Diffraction, St. Petersburg, 25-29 May 2015, 81-86.
- Strehlke, S., Bastide, S., Guillet, J. and Lévy-Clément, C. (2011) Design of Porous Silicon Antireflection Coatings for Silicon Solar Cells. Materials Science and Engineering, 69, 81-86.
- Lee, I., Lim, D.G., Lee, S.H. and Yi, J. (2001) The Effect of a Double Layer Anti-Reflection Coating for a Buried Contact Solar Cell Application. Surface and Coatings Technology, 137, 86-91. https://doi.org/10.1016/S0257-8972(00)01076-8
- Mitsa, A., Holovács, J. and Petcko, V. (2014) Optimization of Structure of the Wide Band Interference Filters. Proceedings of the 9th International Conference on Applied Informatics, 2, 17-21.
- Katsidis, C.C. and Siapkas, D.I. (2002) General Transfer-Matrix Method for Optical Multilayer Systems with Coherent, Partially Coherent, and Incoherent Interference. Applied Optics, 41, 3978-3987. https://doi.org/10.1364/AO.41.003978
- Troparevsky, M.C., Sabau, A.S., Lupini, A.R. and Zhang, Z. (2010) Transfer-Matrix Formalism for the Calculation of Optical Response in Multilayer Systems: From Coherent to Incoherent Interference. Optics Express, 18, 24715-24721. https://doi.org/10.1364/OE.18.024715
- Dyakov, S.A., Tolmachev, V.A., Astrova, E.V., Tikhodeev, S.G., Timoshenko, V.Yu. and Perova, T.S. (2010) Numerical Methods for Calculation of Optical Properties of Layered Structures. Proceedings of SPIE, 7521, 75210G-1-75210G-10.
- Sahoo, K.C., Lin, M.-K., Chang, E.-Y., Lu, Y.-Y., Chen, C.-C., Huang, J.-H. and Chang, C.-W. (2009) Fabrication of Antireflective Sub-Wavelength Structures on Silicon Nitride Using Nano Cluster Mask for Solar Cell Application. Nanoscale Research Letters, 4, 680-683. https://doi.org/10.1007/s11671-009-9297-7
- Santana, G. and Morales-Acevedo, A. (2000) Optimization of PECVD SiN:H Films for Silicon Solar Cells. Solar Energy Materials & Solar Cells, 60, 135-142. https://doi.org/10.1016/S0927-0248(99)00078-1
- Beye, M., Faye, M.E., Ndiaye, A., Ndiaye, F. and Maiga, A.S. (2013) Optimization of SiNx Single and Double Layer ARC for Silicon Thin Film Solar Cells on Glass. Research Journal of Applied Sciences, Engineering and Technology, 6, 412-416. https://doi.org/10.19026/rjaset.6.4094